Seagate ST3655N Manual de usuario descargar pdf (Pagina 130)

SANtools® S.M.A.R.T. Disk Monitor (SMARTMon-UX)124

software to do the write/read/compare of X blocks, increment block number and continue until end-of-disk. Enter "N"

to instruct the software to first write the data on the entire disk sequentially, then do a read/compare sequentially. Due

to the performance benefits of caching, then the single-pass version will generally complete faster. As some users

might not want the data to be in cache on the read/compare part of the test, we add the SINGLEYN flag as an option.

CHUNKSIZE corresponds to the number of blocks that will be processed in each I/O. The maximum CHUNKSIZE is

64 which would correspond to a 32KB I/O, assuming the standard 512 byte block size. The larger the CHUNKSIZE,

the faster the program runs, but this assumes the user wants a large chunk size. As this is not so much a benchmark

as a diagnostic routine, we offer the ability to control the chunk size.

The DeviceName must be a single device name. No wild-cards are supported in this release. This is because the test

is quite destructive. Future revisions of this software may allow wild-cards if customer requests warrant this flexibility.

You may optionally add the -12 or -16 to force the test to attempt to use 12 or 16-byte CDBs. This will provide you

with a method which will determine if both your host machine and the target device reports the 12 or 16-byte read and

or write commands.

Example

The test below was run on a 256 MB Sony memory stick plugged into a USB port under LINUX.

smartmon-ux -scrubdiv E5F5FF00 Y 1 /dev/sg3

Discovered Sony Storage Media S/N " " on /dev/sg3 (SMART unsupported)(250 MB)

****************************************************************************************

* Warning: You have instructed the operating system to perform a data integrity *

* check on the selected device. No checks will be made to verify that the *

* device isn't mounted or in use in any way. *

* *

* * * * THIS WILL DESTROY ALL DATA ON THE SELECTED DEVICE * * * *

* *

* The test will write your pattern on every byte of the media, with the *

* exception of end-of-block markers in order to perform a data alignment *

* test. *

* *

* Please make sure the disk is unmounted before proceeding. This will *

* insure that the operating system will not write to the device during *

* test which would cause the test to fail. *

* *

****************************************************************************************

The selected device is:"Sony Storage Media at /dev/sg3":

Are you sure you want to do this? Answer "YES" to begin, anything else exits program: YES

Beginning SANtools data integrity test for Sony Storage Media at /dev/sg3 (512000 blocks, blocksize=512,

chunksize=1)

00% (< --- This line is updated after every 1% completion)

Block 0000000Ah Sense: 1/10/00 [Recovered error] CRC or ECC error

Block 0000000Fh Sense: 1/10/00 [Recovered error] CRC or ECC error

100%

SANtools data integrity test (Write Phase) completed for Sony Storage Media at /dev/sg3 with 4 Sense Code

Events: PASSED-WARNINGS

Block 0000000A 1/10/00 Count=2 [Recovered error] CRC or ECC error

Block 0000000F 1/10/00 Count=2 [Recovered error] CRC or ECC error

SANtools data integrity test (Verify Phase) completed for Sony Storage Media at /dev/sg3 with 0 Data

Validation (Byte) Errors: PASSED

Data Validation Test: PASSED

In this case, the device returned several recoverable errors during the write phase. This test still passed as all events

were recoverable. If there were no events, then the test would have returned the string PASSED. If there were any

unrecovered errors, then the write phase would have returned FAILED. (Unrecovered errors are marked by returned

sense key values of 3, 4, 5, 7, 8, and Bh.

Frequently Asked Questions

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